VLSI Test Principles & Architecture: Design for Testability

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TextPublication details: New Delhi Elsevier 2011Description: xxix,777ISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	NMIT	ECE	621.395 WAN (Browse shelf(Opens below))	Checked out	2026-02-04	46429

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