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ISBD view for VLSI Test Principles & Architecture

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VLSI Test Principles & Architecture

Wang, Laung-Terng, Wu, Cheng-Wen

VLSI Test Principles & Architecture - New Delhi Morgan Kaufmann 2006 - xxx,777

ISBN: NMIT004423

VLSI Test Principles & Architecture

APA

Wang L. W. C., . (2006). VLSI Test Principles & Architecture. New Delhi: Morgan Kaufmann.

Chicago

Wang Laung-Terng Wu Cheng-Wen, . 2006. VLSI Test Principles & Architecture. New Delhi: Morgan Kaufmann.

Harvard

Wang L. W. C., . (2006). VLSI Test Principles & Architecture. New Delhi: Morgan Kaufmann.

MLA

Wang Laung-Terng Wu Cheng-Wen, . VLSI Test Principles & Architecture. New Delhi: Morgan Kaufmann. 2006.

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