Digital Circuit Testing and Testability
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TextPublication details: New Delhi Academic PressDescription: xi,199ISBN: - 0124343309
| Item type | Current library | Collection | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|
| Books | NMIT | ECE | 621.395 028 7 LAL (Browse shelf(Opens below)) | Available | 51197 |
Browsing NMIT shelves,Collection: ECE Close shelf browser (Hides shelf browser)
| 621.392 ROT Digital Systems Design using VHDL | 621.392 SMI Programming the PIC Microcontroller with MBasic | 621.392 VAL Introductory VHDL: From Simulation to Synthesis | 621.395 028 7 LAL Digital Circuit Testing and Testability | 621.395 ABR Digital Systems Testing and Testable Design | 621.395 ABR Digital Systems Testing and Testable Design | 621.395 ACT FPGA Data book and Design Guide |
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