VLSI Test Principles & Architecture
Material type:
TextPublication details: N.Delhi Tata Mcgraw Hill Publishing Company P.Ltd. 2010Description: 461ISBN: - NMIT018942
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Books
|
NMIT | ECE | 621.395 WAN (Browse shelf(Opens below)) | Available | 46429 |
Browsing NMIT shelves, Collection: ECE Close shelf browser (Hides shelf browser)
| 621.395 WAK Digital Design Principles and Practices | 621.395 WAK Digital Design : Principles and Practices | 621.395 WAN VLSI Test Principles & Architecture | 621.395 WAN VLSI Test Principles & Architecture | 621.395 WES Principles of CMOS VLSI Design | 621.395 WES Principles of CMOS VLSI Design | 621.395 WES CMOS VLSI Design: A Circuits and System Perspectives |
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