Digital Circuit Testing and Testability
Material type:
TextPublication details: Delhi Orient Paperbacks, 2001Description: 200ISBN: - 0124343309
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Books
|
NMIT | ECE | 621.395 028 7 LAL (Browse shelf(Opens below)) | Checked out | 2022-12-01 00:00 | 51197 |
Browsing NMIT shelves, Collection: ECE Close shelf browser (Hides shelf browser)
| 621.392 ROT Digital Systems Design usnig VHDL | 621.392 SMI Programming the PIC Microcontroller with Basic | 621.392 VAL Introductory VHDL | 621.395 028 7 LAL Digital Circuit Testing and Testability | 621.395 5 GOD Operational Amplifiers and Linear ICs | 621.395 ABR Digital Systems Testing and Testable Design | 621.395 ACT FPGA Data book and Design Guide |
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