| Item type | Current library | Collection | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|
| Reference | NMIT | ECE | 621.395 WES (Browse shelf(Opens below)) | Available | 2911 |
| 621.395 WAN VLSI Test Principles & Architecture | 621.395 WAN VLSI Test Principles & Architecture: Design for Testability | 621.395 WES Principles of CMOS VLSI Design | 621.395 WES Principles of CMOS VLSI Design: A Systems Perspective | 621.395 WES Principles of CMOS VLSI Design | 621.395 WES Principles of CMOS VLSI Design | 621.395 WES Principles of CMOS VLSI Design |
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