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	1.	Defects in High-k Gate Dielectric Stacks [electronic resource] : Nano-Electronic Semiconductor Devices / edited by Evgeni Gusev. by Gusev, Evgeni [editor.] SpringerLink (Online service) Series: NATO Science Series II: Mathematics, Physics and Chemistry ; 220 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Dordrecht : Springer Netherlands, 2006 Other title: Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-K Dielectric Nano-Electronic Semiconductor Devices, St. Petersburg, Russia, from 11 to 14 July 2005. In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	2.	Advanced Gate Stacks for High-Mobility Semiconductors [electronic resource] / edited by Athanasios Dimoulas, Evgeni Gusev, Paul C. McIntyre, Marc Heyns. by Dimoulas, Athanasios [editor.] Gusev, Evgeni [editor.] McIntyre, Paul C [editor.] Heyns, Marc [editor.] SpringerLink (Online service) Series: Advanced Microelectronics ; 27 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2007 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)

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