Your search returned 2 results.

Results
	1.	VLSI Test Principles & Architecture by Wang, Laung-Terng, Wu, Cheng-Wen Edition: 2 Material type: Text; Format: print ; Literary form: Not fiction Publication details: Rasha publication Bangalore 2014 Availability: Items available for reference: NMIT: Not for loan (1)Call number: 621.395 WAN. Save to lists Add to cart (remove)
	2.	VLSI Test Principles & Architecture by Wang, Laung-Terng, Wu, Cheng-Wen Material type: Text; Format: print ; Literary form: Not fiction Publication details: N.Delhi Tata Mcgraw Hill Publishing Company P.Ltd. 2010 Availability: Items available for loan: NMIT (1)Call number: 621.395 WAN. Place hold Save to lists Add to cart (remove)

Refine your search