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	1.	Introduction to Advanced System-on-Chip Test Design and Optimization [electronic resource] / by Erik Larsson. by Larsson, Erik [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 29 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2005 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	2.	Fault Diagnosis of Analog Integrated Circuits [electronic resource] / by Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha. by Kabisatpathy, Prithviraj [author.] Barua, Alok [author.] Sinha, Satyabroto [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 30 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2005 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	3.	Data Mining and Diagnosing IC Fails [electronic resource] / by Leendert M. Huisman. by Huisman, Leendert M [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 31 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2005 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	4.	Gizopoulos / Advances in ElectronicTesting [electronic resource] / edited by Dimitris Gizopoulos. by Gizopoulos, Dimitris [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 27 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	5.	Digital Timing Measurements [electronic resource] : From Scopes and Probes to Timing and Jitter / by Wolfgang Maichen. by Maichen, Wolfgang [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 33 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	6.	The Core Test Wrapper Handbook [electronic resource] : Rationale and Application of IEEE Std. 1500™ / by Francisco Silva, Teresa McLaurin, Tom Waayers. by Silva, Francisco [author.] McLaurin, Teresa [author.] Waayers, Tom [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 35 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	7.	Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez. by Sachdev, Manoj [editor.] Gyvez, José Pineda de [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 34 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2007 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	8.	Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor. by Tehranipoor, Mohammad [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 37 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	9.	Oscillation-Based Test in Mixed-Signal Circuits [electronic resource] / by Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz. by Sánchez, Gloria Huertas [author.] García de la Vega, Diego Vázquez [author.] Rueda, Adoración Rueda [author.] Díaz, José Luis Huertas [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 36 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Dordrecht : Springer Netherlands, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	10.	CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev. by Pavlov, Andrei [author.] Sachdev, Manoj [author.] SpringerLink (Online service) Series: Frontiers In Electronic Testing ; 40 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	11.	New Methods of Concurrent Checking [electronic resource] / by Michael Göessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld. by Göessel, Michael [author.] Ocheretny, Vitaly [author.] Sogomonyan, Egor [author.] Marienfeld, Daniel [author.] SpringerLink (Online service) Series: Frontiers In Electronic Testing ; 42 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	12.	Soft Errors in Modern Electronic Systems [electronic resource] / edited by Michael Nicolaidis. by Nicolaidis, Michael [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 41 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US : Imprint: Springer, 2011 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)
	13.	Models in Hardware Testing [electronic resource] : Lecture Notes of the Forum in Honor of Christian Landrault / edited by Hans-Joachim Wunderlich. by Wunderlich, Hans-Joachim [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 43 Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Dordrecht : Springer Netherlands, 2010 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Add to cart (remove)