000 00335nam a2200133Ia 4500
005 20250814115421.0
008 250729s9999 xx 000 0 und d
020 _a0124343309
100 _aLala, Parag K
245 0 _aDigital Circuit Testing and Testability
260 _aNew Delhi
_bAcademic Press
300 _axi,199
942 _cREF
999 _c11909
_d11909