000 | 03395nam a22005295i 4500 | ||
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001 | 978-3-642-20233-9 | ||
003 | DE-He213 | ||
005 | 20201213203955.0 | ||
007 | cr nn 008mamaa | ||
008 | 110331s2011 gw | s |||| 0|eng d | ||
020 |
_a9783642202339 _9978-3-642-20233-9 |
||
024 | 7 |
_a10.1007/978-3-642-20233-9 _2doi |
|
050 | 4 | _aTK7800-8360 | |
050 | 4 | _aTK7874-7874.9 | |
072 | 7 |
_aTJF _2bicssc |
|
072 | 7 |
_aTEC008000 _2bisacsh |
|
072 | 7 |
_aTEC008070 _2bisacsh |
|
082 | 0 | 4 |
_a621.381 _223 |
100 | 1 |
_aCataldo, Andrea. _eauthor. |
|
245 | 1 | 0 |
_aBroadband Reflectometry for Enhanced Diagnostics and Monitoring Applications _h[electronic resource] / _cby Andrea Cataldo, Egidio De Benedetto, Giuseppe Cannazza. |
264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2011. |
|
300 |
_aXVIII, 150 p. _bonline resource. |
||
336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
||
347 |
_atext file _bPDF _2rda |
||
490 | 1 |
_aLecture Notes in Electrical Engineering, _x1876-1100 ; _v93 |
|
505 | 0 | _aIntroduction -- Basic Physical Principles -- Broadband Reflectometry: Theoretical Background.- Quantitative and Qualitative Characterization of Liquid Materials -- Qualitative Characterization of Granular Materials and Moisture -- Measurements -- BMR Characterization of Antennas Through the Combined TD/FD -- Approach. | |
520 | _aThis book is dedicated to the adoption of broadband microwave reflectometry (BMR)-based methods for diagnostics and monitoring applications. This electromagnetic technique has established as a powerful tool for monitoring purposes; in fact, it can balance several contrasting requirements, such as the versatility of the system, low implementation cost, real-time response, possibility of remote control, reliability, and adequate measurement accuracy. Starting from an extensive survey of the state of the art and from a clear and concise overview of the theoretical background, throughout the book, the different approaches of BMR are considered (i.e., time domain reflectometry - TDR, frequency domain reflectometry - FDR, and the TDR/FDR combined approach) and several applications are thoroughly investigated. The applications considered herein are very diverse from each other and cover different fields. In all the described procedures and methods, the ultimate goal is to endow them with a significant performance enhancement in terms of measurement accuracy, low cost, versatility, and practical implementation possibility, so as to unlock the strong potential of BMR. | ||
650 | 0 | _aEngineering. | |
650 | 0 | _aMicrowaves. | |
650 | 0 | _aElectronics. | |
650 | 1 | 4 | _aEngineering. |
650 | 2 | 4 | _aElectronics and Microelectronics, Instrumentation. |
650 | 2 | 4 | _aMicrowaves, RF and Optical Engineering. |
650 | 2 | 4 | _aMeasurement Science and Instrumentation. |
650 | 2 | 4 | _aOptics, Optoelectronics, Plasmonics and Optical Devices. |
700 | 1 |
_aDe Benedetto, Egidio. _eauthor. |
|
700 | 1 |
_aCannazza, Giuseppe. _eauthor. |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783642202322 |
830 | 0 |
_aLecture Notes in Electrical Engineering, _x1876-1100 ; _v93 |
|
856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-642-20233-9 |
912 | _aZDB-2-ENG | ||
950 | _aEngineering (Springer-11647) | ||
999 |
_c23602 _d23602 |