000 04477nam a22005415i 4500
001 978-94-007-4147-8
003 DE-He213
005 20201213204257.0
007 cr nn 008mamaa
008 120427s2012 ne | s |||| 0|eng d
020 _a9789400741478
_9978-94-007-4147-8
024 7 _a10.1007/978-94-007-4147-8
_2doi
050 4 _aQC450-467
050 4 _aQC718.5.S6
072 7 _aPNFS
_2bicssc
072 7 _aPDND
_2bicssc
072 7 _aSCI078000
_2bisacsh
082 0 4 _a621.36
_223
100 1 _aDoornbos, Richard.
_eeditor.
245 1 0 _aFrom scientific instrument to industrial machine
_h[electronic resource] :
_bCoping with architectural stress in embedded systems /
_cedited by Richard Doornbos, Sjir van Loo.
264 1 _aDordrecht :
_bSpringer Netherlands,
_c2012.
300 _aXII, 112p. 55 illus.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSpringerBriefs in Electrical and Computer Engineering,
_x2191-8112
505 0 _aForeword -- Acknowledgements -- Part I Introduction -- 1. The Endeavor -- Part II Architecture -- 2. Systems Architecture -- 3. Feasibility prototyping -- 4. Software architecture -- Part III Automation and control functions -- 5. Applications in automated microscopy -- 6. Focusing control -- 7. Positioning control -- Part IV Conclusion -- 8. Final words -- Appendix. Condor Project Publications.
520 _aArchitectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In From scientific instrument to industrial machine, we look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company. Traditionally, transmission electron microscopes are manually operated scientific instruments, but they also have enormous potential for use in industrial applications. However, this new market has quite different characteristics. There are strong demands for cost-effective analysis, accurate and precise measurements, and ease-of-use. These demands can be translated into new system qualities, e.g. reliability, predictability and high throughput, as well as new functions, e.g. automation of electron microscopic analyses, automated focusing and positioning functions. From scientific instrument to industrial machine takes a pragmatic approach to the problem of architectural stress. In particular, it describes the outcomes of the Condor project, a joint endeavour by a consortium of industrial and academic partners. In this collaboration an integrated approach was essential to successfully combine various scientific results and show the first steps towards a new direction. System modelling and prototyping were the key techniques to develop better understanding and innovative solutions to the problems associated with architectural stress. From scientific instrument to industrial machine is targeted mainly at industrial practitioners, in particular system architects and engineers working on high tech systems. It can therefore be read without particular knowledge of electron microscope systems or microscopic applications. The book forms a bridge between academic and applied science, and high tech industrial practice. By showing the approaches and solutions developed for the electron microscope, it is hoped that system designers will gain some insights in how to deal with architectural stress in similar challenges in the high tech industry.
650 0 _aPhysics.
650 0 _aSoftware engineering.
650 0 _aComputer system performance.
650 0 _aEngineering mathematics.
650 1 4 _aPhysics.
650 2 4 _aSpectroscopy and Microscopy.
650 2 4 _aAppl.Mathematics/Computational Methods of Engineering.
650 2 4 _aSpecial Purpose and Application-Based Systems.
650 2 4 _aMathematical Modeling and Industrial Mathematics.
650 2 4 _aSystem Performance and Evaluation.
700 1 _avan Loo, Sjir.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9789400741461
830 0 _aSpringerBriefs in Electrical and Computer Engineering,
_x2191-8112
856 4 0 _uhttp://dx.doi.org/10.1007/978-94-007-4147-8
912 _aZDB-2-ENG
950 _aEngineering (Springer-11647)
999 _c24802
_d24802