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| 005 | 20250814115233.0 | ||
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| 020 | _aNMIT004423 | ||
| 040 | _cnmit | ||
| 100 | _aWang, Laung-Terng, Wu, Cheng-Wen | ||
| 245 | 0 | _aVLSI Test Principles & Architecture | |
| 260 |
_aNew Delhi _bMorgan Kaufmann _c2006 |
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