VLSI Test Principles & Architecture
Material type:
TextPublication details: New Delhi Morgan Kaufmann 2006Description: xxx,777ISBN: - NMIT004423
| Item type | Current library | Collection | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|
| Reference | NMIT | ECE | 621.395 WAN (Browse shelf(Opens below)) | Available | 18080 |
Browsing NMIT shelves,Collection: ECE Close shelf browser (Hides shelf browser)
| 621.395 WAK Digital Design: Principles and Practices | 621.395 WAK Digital Design: Principles and Practices | 621.395 WAK Digital Design: Principles and Practices | 621.395 WAN VLSI Test Principles & Architecture | 621.395 WAN VLSI Test Principles & Architecture: Design for Testability | 621.395 WES Principles of CMOS VLSI Design | 621.395 WES Principles of CMOS VLSI Design: A Systems Perspective |
There are no comments on this title.
Log in to your account to post a comment.